- Manufacturer：
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- Texas Instruments (29)
- ON Semiconductor (3)
- NXP USA Inc. (3)
- Part Status：
-
- Package / Case：
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- Supplier Device Package：
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- Logic Type：
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35 Records
| Image | Part | Manufacturer | Description | Price | MOQ | Stock | Action |
|---|---|---|---|---|---|---|---|
|
NXP USA Inc. | IC 9BIT DUAL LATC... |
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|
0 | 0 | Get Quote | |
|
|
NXP USA Inc. | IC 9BIT DUAL LATC... |
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|
0 | 0 | Get Quote | |
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|
NXP USA Inc. | IC 9BIT DUAL LATC... |
-
|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC SCAN TEST DEVI... |
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|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC SCAN-TEST-DEV/... |
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|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC SCAN TEST DEVI... |
|
1,000 | 0 | Get Quote | |
|
|
Texas Instruments | IC SCAN TEST DEVI... |
|
1,000 | 0 | Get Quote | |
|
|
Texas Instruments | IC SCAN TEST DEV ... |
|
2,000 | 0 | Get Quote | |
|
|
ON Semiconductor | TXRX W/GENERATOR... |
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|
0 | 0 | Get Quote | |
|
|
ON Semiconductor | TXRX W/GENERATOR... |
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|
0 | 0 | Get Quote | |
|
|
ON Semiconductor | TXRX W/GENERATOR... |
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|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC ADDRESSABLE S... |
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0 | 0 | Get Quote | |
|
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Texas Instruments | IC ADDRESSABLE S... |
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|
0 | 0 | Get Quote | |
|
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Texas Instruments | IC SCAN TEST DEVI... |
-
|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC SCAN TEST DEVI... |
-
|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC SCAN TEST DEVI... |
-
|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC SCAN TEST DEVI... |
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|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC 18BIT INV BUS T... |
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|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC SCAN TESST DEV... |
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|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC SCAN TESST DEV... |
-
|
0 | 0 | Get Quote |
