- Manufacturer：
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- Texas Instruments (206)
- ON Semiconductor (25)
- NXP USA Inc. (15)
- Series：
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- Part Status：
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- Operating Temperature：
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- Mounting Type：
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- Package / Case：
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- Supplier Device Package：
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- Number of Bits：
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- Logic Type：
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249 Records
| Image | Part | Manufacturer | Description | Price | MOQ | Stock | Action |
|---|---|---|---|---|---|---|---|
|
NXP USA Inc. | IC 9BIT DUAL LATC... |
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|
0 | 0 | Get Quote | |
|
|
NXP USA Inc. | IC 9BIT DUAL LATC... |
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|
0 | 0 | Get Quote | |
|
|
NXP USA Inc. | IC 9BIT DUAL LATC... |
-
|
0 | 0 | Get Quote | |
|
|
NXP USA Inc. | IC 9BIT DUAL LATC... |
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|
0 | 0 | Get Quote | |
|
|
NXP USA Inc. | IC 9BIT DUAL LATC... |
-
|
0 | 0 | Get Quote | |
|
|
NXP USA Inc. | IC 9BIT DUAL LATC... |
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|
0 | 0 | Get Quote | |
|
|
NXP USA Inc. | IC BINARY FULL AD... |
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|
0 | 0 | Get Quote | |
|
|
NXP USA Inc. | IC BINARY FULL AD... |
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|
0 | 0 | Get Quote | |
|
|
NXP USA Inc. | IC BUFFER/LDRIVE... |
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|
0 | 0 | Get Quote | |
|
|
ON Semiconductor | TXRX BIDIRECT IE... |
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|
0 | 0 | Get Quote | |
|
|
ON Semiconductor | TXRX BIDIRECT IE... |
-
|
0 | 0 | Get Quote | |
|
|
ON Semiconductor | TXRX BIDIRECT IE... |
-
|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC SCAN TEST DEVI... |
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|
0 | 0 | Get Quote | |
|
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Texas Instruments | IC SCAN TEST DEVI... |
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|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC SCAN TEST DEVI... |
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|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC SCAN-TEST-DEV/... |
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|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC 7BIT TTL/BTL XC... |
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|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC 8-BIT TTL/BTL X... |
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|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC 17-BIT TTL/BTL X... |
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|
0 | 0 | Get Quote | |
|
|
Texas Instruments | IC 9-BIT ADDR/DATA... |
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|
0 | 0 | Get Quote |
