- Manufacturer:
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- Texas Instruments (64)
- ON Semiconductor (6)
- NXP USA Inc. (6)
- Part Status:
-
- Package / Case:
-
- Supplier Device Package:
-
- Logic Type:
-
76 Records
Image | Part | Manufacturer | Description | Price | MOQ | Stock | Action |
---|---|---|---|---|---|---|---|
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NXP USA Inc. | IC 9BIT DUAL LATC... |
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|
0 | 0 | Get Quote | |
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NXP USA Inc. | IC 9BIT DUAL LATC... |
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|
0 | 0 | Get Quote | |
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NXP USA Inc. | IC 9BIT DUAL LATC... |
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|
0 | 0 | Get Quote | |
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NXP USA Inc. | IC 9BIT DUAL LATC... |
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|
0 | 0 | Get Quote | |
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NXP USA Inc. | IC 9BIT DUAL LATC... |
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|
0 | 0 | Get Quote | |
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NXP USA Inc. | IC 9BIT DUAL LATC... |
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|
0 | 0 | Get Quote | |
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Texas Instruments | IC SCAN TEST DEVI... |
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|
0 | 0 | Get Quote | |
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Texas Instruments | IC SCAN TEST DEVI... |
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|
0 | 0 | Get Quote | |
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Texas Instruments | IC SCAN TEST DEVI... |
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|
0 | 0 | Get Quote | |
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Texas Instruments | IC SCAN-TEST-DEV/... |
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|
0 | 0 | Get Quote | |
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Texas Instruments | IC ADDRESSABLE S... |
|
50 | 3,950 | Buy Now Get Quote | |
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Texas Instruments | IC ADDRESSABLE S... |
|
60 | 4,320 | Buy Now Get Quote | |
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Texas Instruments | IC SCAN TEST DEVI... |
|
160 | 0 | Get Quote | |
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Texas Instruments | IC SCAN TEST DEVI... |
|
1,000 | 0 | Get Quote | |
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Texas Instruments | IC SCAN TEST DEVI... |
|
40 | 0 | Get Quote | |
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Texas Instruments | IC SCAN TEST DEVI... |
|
80 | 0 | Get Quote | |
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Texas Instruments | IC SCAN TEST DEVI... |
|
1,000 | 0 | Get Quote | |
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Texas Instruments | IC SCAN TEST DEVI... |
|
100 | 0 | Get Quote | |
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Texas Instruments | IC SCAN TEST DEV ... |
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|
1 | 190 | Get Quote | |
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Texas Instruments | IC SCAN TEST DEV ... |
|
1 | 190 | Buy Now Get Quote |